Study on Digital Forensics in IoS Devices

Authors

  • P. Ravi Shankar MVGR College of Engineering, Vizianagaram, India
  • P. Parimala MVGR College of Engineering, Vizianagaram, India
  • P. Krishna Subba Rao MVGR College of Engineering, Vizianagaram, India
  • Ch. Avinash Gayatri Vidya Parishad College of Engineering (A), Visakhapatnam, India

DOI:

https://doi.org/10.37591/ecft.v1i1.91

Keywords:

Forensics, triaging, IoS, chip-off, jail breaking

Abstract

Digital forensics has progressed rapidly but much more is required, including developing more sophisticated techniques for acquiring and analyzing digital evidence, increasing scientific rigor in our work, and also professionalizing the field. This paper surveys the area of digital forensics, with the aim of systematizing the existing techniques which is useful for promoting future research. The authors first present the unique aspects and also the tools used in digital forensics. Finally, they summarize the lessons learnt and discuss future research opportunities in the area of portable devices like smart phones, IoS devices, etc.

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Published

2016-01-05

Issue

Section

Research Articles